Showing results: 781 - 795 of 976 items found.
-
NI
Whether you are performing high-accuracy, low-speed measurements on a dozen test points or high-channel, high-frequency characterizations of integrated circuits, National Instruments delivers a flexible, modular switching solution based on PXI or SCXI to help you maximize equipment reuse, test throughput, and system scalability.
-
Model 933 -
TRICOR Systems Inc.
The Model 933A Life Cycle Test System is a low cost, generic test platform used to perform cycling of keypads, keyboards, membranes, switches, or any product requiring fatigue testing.
-
TA-3C -
Tech-Aid Products
The TA-3C test fixture is a combination of the KMD540 testing requirements and the RDR-2000/2100 weather radar interface requirements. This panel allows the technician to test the KMD540 MFD as a stand alone item (with external simulators) or together with a radar sensor for a dynamic real time test. The panel includes the required switching for sensor alignment and KMD testing along with input jacks for the required data inputs. Also built into the fixture is an analog gyro simulator for checking the stabilization functions of the sensor. The full enclosure comes in standard panel width.
-
Accel-RF Corporation
The advanced development of new technologies, such as SiC and GaN, have opened the opportunity for more efficient and higher voltage/power performance in switching and power management circuits. Their high cutoff frequencies, low on-state resistance, and very high breakdown voltages can increase power supply power handling densities approaching hundreds of watts/inch. Reliability of these new technologies and techniques is critical for realizing practical applications. While Silicon devices have a rich history of proven reliability, these newer compound semiconductor technologies are too new to have a reliability history and have not been well proven. Further, process variations, even in well-controlled lines, yield widely varying results. This has driven the need for additional testing and to burn-in devices prior to delivery.
-
QATM GmbH
QATM micro hardness testers for Vickers, Knoop and Brinell cover a test load range from 0.25 g to 62.5 kg. All hardness testers are equipped with an intuitive software that allows easy operation, analysis, and documentation of results. Turrets with either 6 or 8 different test diamonds or lenses can be mounted, which makes switching between Vickers, Knoop and Brinell hardness testing very simple.
-
Phoenix Contact GmbH & Co. KG
FAME is the innovative, modular plug-in test system for measuring and testing tasks in protection technology for medium-voltage and high-voltage switchgear. The plug-in test system combines complex switching operations for testing the function of current transformers and voltage transducers, as well as tripping and signal contacts.
-
ShibaSoku Co., Ltd.
This system is suitable for DC testing of IGBT, IGBT module (1in1～7in1). Built-in hi-current switching relay circuit inside test head, it is capable ofDC testing from device itself to module. Highly accurate repeatability testing is available by high speed rise time which is suppressed its heat in hi-current
-
High Voltage Switching Test System -
Accel-RF Corporation
The Accel-RF Power-Switching Test System is capable of measuring reliability under a variety of conditions for switching power applications up to 1kV (off) and 25A (on) at rates up to 1MHz switching frequency, dependent on voltage. By leveraging technology developed for the RF burn-in tray platform with new fast switching measurement techniques, this system can support testing of multiple devices under elevated temperature stimulus in a small physical area, and offers the flexibility to test both soft- and hard-switching applications. The Accel-RF Power-Switching System is the most flexible and accurate power switching platform available.
-
Thorlabs, Inc.
Thorlabs offers the PRO8 modular test and measurement platform in 2-slot and 8-slot configurations. These customizable bench top chassis let users build a compact fiber or laser diode testing platforms for their lab or factory floor. Modules include lasers, TEC controllers, optical switches, and current controllers.
-
Electromechanica, Inc.
The rail inverter test system uses a pulse test methodology to verify proper operation of the IGBT switching elements in a subway car motor control. The system is designed to verify proper commutation of the switching elements. A large capacitor bank allows testing at DC voltages up to 1kV and peak currents of up to 3kA into reactive loads.The system also integrates self test capabilities and safe-to-turn-on (STTO) diagnostics to ensure no gross faults are present prior to the application of high voltages. Further the system includes dielectric withstand (hi-pot) test capability to ensure electrical safety.
-
Mostrak-2 -
ipTest Limited
M2 test system has multiple test generators which cover static and dynamic test procedures. It is our first truly modular tester which allows for the system to be upgraded and expanded when needed. M2 are designed to get the tester as close as possible to the handler interface and operator at the highest possible speeds. M2 is capable of HV (3 kV) and LV (600A) testing and has dynamic switching capabilities up to 1200V. MOSTRAK systems can test the following device types: MOSFET, IGBT, Bipolar transistor, Diode - rectifiers, Thyristor (SCR) - Triac, Linear voltage regulator (VReg), Transient voltage suppressor (TVS).
-
SOMA GmbH
Haptic tests are becoming ever more important owing to the increasing and sector-independent popularity of switches and buttons in diverse products. More and more customers, especially in the automobile sector, attach great value to good haptic performance by their control elements. A precise switching feeling, low friction of the moving elements, backlash-free execution both in the rest position and during operation are only some of the criteria for good haptic switching characteristics.
-
MK Test Systems Ltd.
These specialist Automeg models test the function and integrity of wiring harnesses combined with active components such as relays, switches, contactors, diodes, LEDS, actuators and other active components.Our software takes the complex and traditionally long task of creating functional tests away from the test engineer and allows these to be created automatically, from existing ECAD data and our component library and automated software routines. All the different routes and subtests are automatically calculated in seconds.
-
MK Test Systems Ltd.
A modular test system, RTS (real time scanner) provides instant test results with minimal interface cables to check wiring during installation.It tests wire harnesses in real time using our micro switching technology, reducing the need for high cost interface cables by around 90%. an innovative best-in-class solution for FAL testing, RTS also offers many benefits for wire harness and sub-assembly manufacturers.
-
DC3 -
Hilevel Technology, Inc.
The wafer has been fully tested, cut and packaged. Today's IC manufacturers are finding tremendous cost savings in performing just fast DC tests on these packaged parts rather than running the full wafer tests all over again. Until now this required either an expensive full-power IC tester, or a "rack-n-stack" collection of instruments. Enter the HILEVEL DC3 Co-Optive Parametric Tester. No more instruments, no switching matrix, no tricky software. The DC3 combines a high-precision DC-PMU and internal DUT supplies to test up to 2,048 pins, all in a single chassis with Multi-Site capability up to 64 sites. And every DC3 includes our Classic Curve Trace feature, allowing easy curve tracing on every pin.
